Davis Millimeter-Wave Research Center

Microwave/Millimeter Wave Technology

Plasma Diagnostics

 

 

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Plasma diagnostics

 

µ-wave vacuum electronics

 

µ-wave solid state technology

 

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Prof. N.C. Luhmann, Jr.

 

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Electron cyclotron emission imaging (ECEI) is one of the many microwave diagnostics that the DMRC develops and fabricates. Shown above are sample data from the ECEI system on the DIII-D tokamak located at General Atomics in San Diego, CA. ECEI is well-suited for diagnosing MHD activity and interactions across multiple scales. The particular examples above are images from a single DIII-D discharge comparing the fine-scale structure of an Alfvén eigenmode (left) to meso-scale perturbations due to a core-localized kink instability (right). Covering a large region of the plasma in 2D, ECEI enables reconstruction of helically symmetric structures in the entire poloidal plane.

 

 

ECE imaging of the sawtooth crash at the inboard, or high field side, shows that thermal transport occurs along a localized conduction channel, consistent with a model for local magnetic reconnection. The hot plasma is carried leftward, across the temperature inversion radius, and ejected from the tokamak core. The image is unambiguous, composed of localized measurements, and is not subject to the uncertainties associated with the inversion of line integrated measurements.

ECEI systems acquire data with micro-second resolution, allowing for accurate discrimination among coupled and closely spaced eigenmodes. In this case, the linear superposition of two separate Alfvén eigenmodes (left 2 panels) produces a complicated structure (right panel). But, the quality of ECEI data allows these modes to be imaged separately for better understanding of their linear and non-linear stability properties.

 

 

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PREVIOUS  RESEARCH  ACTIVITIES
 
Advanced Accelerators and Light Sources (Reference Only) 
Medical Technologies and Applications (Reference Only)  
Microwave Plasma Interaction (Reference Only)        
MURI 04: NanoPhysics of Electron Dynamics near Surfaces in High Power Microwave Devices and Systems (Reference Only)
MURI 99 (Reference Only)
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